MEASURING DEVICE AND MANUFACTURING METHOD FOR SAME

摘要

The present invention relates to a measuring device for measuring the presence or volume of an object to be measured retained therein by means of exposing the measuring device to electromagnetic waves and detecting the properties of the electromagnetic waves scattered by the measuring device, said measuring device being characterized: in that the measuring device includes a structure with arranged gaps that is formed from metal, has a pair of mutually facing main faces, and has a plurality of gaps formed so as to pass through the pair of main faces, and includes host molecules having adsorptive capacity for the object to be measured; and in that the host molecules are bonded to the surface of the structure with arranged gaps via ether bonds.