发明名称 |
SAMPLE TEST STAGE FOR INFRARED SPECTROMETER |
摘要 |
The present invention relates to a sample mount for an infrared spectroscope and, more specifically, to a sample mount for an infrared spectroscope, capable of conveniently measuring different types of samples without a change in measurement mode and sample state within the sample mount. The present invention may include a mounting plate; a standard sample fixed on one side of the mounting plate; a sample mounting plate disposed on the upper surface of the mounting plate and on which a sample is laid to be inspected through reflection and transmission by an infrared light source; and a fixing unit fixing the sample mounting plate detachably. |
申请公布号 |
KR20140105956(A) |
申请公布日期 |
2014.09.03 |
申请号 |
KR20130019793 |
申请日期 |
2013.02.25 |
申请人 |
SAMSUNG ELECTRO-MECHANICS CO., LTD. |
发明人 |
JEON, JI EUN;YOON, HYO JIN;LIM, SUNG HEE;HAM, SUK JIN |
分类号 |
G01N21/35;G01N1/36 |
主分类号 |
G01N21/35 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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