发明名称 SAMPLE TEST STAGE FOR INFRARED SPECTROMETER
摘要 The present invention relates to a sample mount for an infrared spectroscope and, more specifically, to a sample mount for an infrared spectroscope, capable of conveniently measuring different types of samples without a change in measurement mode and sample state within the sample mount. The present invention may include a mounting plate; a standard sample fixed on one side of the mounting plate; a sample mounting plate disposed on the upper surface of the mounting plate and on which a sample is laid to be inspected through reflection and transmission by an infrared light source; and a fixing unit fixing the sample mounting plate detachably.
申请公布号 KR20140105956(A) 申请公布日期 2014.09.03
申请号 KR20130019793 申请日期 2013.02.25
申请人 SAMSUNG ELECTRO-MECHANICS CO., LTD. 发明人 JEON, JI EUN;YOON, HYO JIN;LIM, SUNG HEE;HAM, SUK JIN
分类号 G01N21/35;G01N1/36 主分类号 G01N21/35
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