| 发明名称 | Charged particle beam irradiation apparatus | ||
| 摘要 | A charged particle beam irradiation apparatus includes: a scanning electromagnet that scans a charged particle beam; and a degrader that is provided on a downstream side of the scanning electromagnet in a scanning direction of the charged particle beam and adjusts a range of the charged particle beam by reducing energy of the charged particle beam. The degrader is configured to be closer to an upstream side in the scanning direction of the charged particle beam, outward in the scanning direction. | ||
| 申请公布号 | US8822965(B2) | 申请公布日期 | 2014.09.02 |
| 申请号 | US201313939914 | 申请日期 | 2013.07.11 |
| 申请人 | Sumitomo Heavy Industries, Ltd. | 发明人 | Asaba Toru |
| 分类号 | H01J3/08;H05H7/12;H05H7/00 | 主分类号 | H01J3/08 |
| 代理机构 | Rader, Fishman & Grauer PLLC | 代理人 | Rader, Fishman & Grauer PLLC |
| 主权项 | 1. A charged particle beam irradiation apparatus comprising: a scanning electromagnet that scans a charged particle beam according to a predetermined scan pattern; and a segmental arch shaped degrader that is provided on a downstream side of the scanning electromagnet extending in a scanning direction of the charged particle beam and adjusts a range of the charged particle beam by reducing energy of the charged particle beam, wherein the degrader is not configured to shape a three-dimensional shape of a portion of a maximum arrival depth of the charged particle beam according to a shape of a tumor portion at a maximum depth. | ||
| 地址 | Tokyo JP | ||