发明名称 ETCHING LIQUID ANALYSIS EQUIPMENT
摘要 Disclosed is an etching liquid analysis apparatus. The etching liquid analysis apparatus includes: a measurement box having a first room into which an etching liquid flows, a second room and a third room in which a concentration of an element contained in the etching liquid and a temperature of the etching liquid are measured, and a fourth room for discharge of the etching liquid; a first piping that allows the etching liquid to flow into the first room from the outside; and a discharge box that is positioned at a lower end of the measurement box so that the etching liquid can be moved to a detection sensor for element concentration measurement or discharged out of the measurement box, wherein a plurality of opening holes that are connected to the discharge box are provided at the lower end of the measurement box. According to the present invention, bubble generation attributable to a chemical reaction between various chemicals contained in the etching liquid or etching liquid flow can be suppressed, and a concentration of copper contained in the etching liquid and a concentration and a temperature of the chemical can be measured in real time. Accordingly, the concentration of the chemicals contained in the etching liquid can be maintained to be constant, and a user does not have to supply the chemicals in person.
申请公布号 KR101436287(B1) 申请公布日期 2014.08.29
申请号 KR20140071821 申请日期 2014.06.13
申请人 KANG, HUN 发明人 KANG, HUN
分类号 G01N35/00;G01D21/02;G01F23/00;G01K13/00;G01N15/06;G01N21/84;G05D7/00;G05D9/00 主分类号 G01N35/00
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