发明名称 NAND FLASH MEMORY UNIT AND NAND FLASH MEMORY ARRAY
摘要 A NAND flash memory unit is described, including a string of memory cells connected in series, S/D regions coupled to two terminals of the string, at least one select transistor couple between a terminal of the string and an S/D region, and at least one erase transistor couple between the at least one select transistor and an S/D region. The select transistor is for selecting the string of memory cells. The erase transistor is for reducing Vt-shift of the select transistor.
申请公布号 US2014239380(A1) 申请公布日期 2014.08.28
申请号 US201414269212 申请日期 2014.05.05
申请人 PHISON ELECTRONICS CORP. 发明人 Lin Wei;Shirota Riichiro;Mitiukhina Nina;Kuo Tsai-Hao
分类号 H01L27/115 主分类号 H01L27/115
代理机构 代理人
主权项 1. A NAND flash memory unit, comprising: a string of memory cells connected in series; two source/drain (S/D) regions coupled to two terminals of the string of memory cells; at least one select transistor coupled between a terminal of the string and an S/D region, for selecting the string of memory cells; and at least one erase transistor coupled between the at least one select transistor and the one of the two S/D regions, wherein a voltage VCG is applied to gates of the memory cells, a voltage VS/D positively higher than the voltage VCG is applied to the S/D regions, a voltage VSG satisfying an inequality of “VSG<VS/D” is applied to a gate of the at least one select transistor, and a voltage VEG satisfying the inequality of “0V≦VEG<VS/D” is applied to the gate of the at least one erase transistor.
地址 Miaoli TW