发明名称 |
NAND FLASH MEMORY UNIT AND NAND FLASH MEMORY ARRAY |
摘要 |
A NAND flash memory unit is described, including a string of memory cells connected in series, S/D regions coupled to two terminals of the string, at least one select transistor couple between a terminal of the string and an S/D region, and at least one erase transistor couple between the at least one select transistor and an S/D region. The select transistor is for selecting the string of memory cells. The erase transistor is for reducing Vt-shift of the select transistor. |
申请公布号 |
US2014239380(A1) |
申请公布日期 |
2014.08.28 |
申请号 |
US201414269212 |
申请日期 |
2014.05.05 |
申请人 |
PHISON ELECTRONICS CORP. |
发明人 |
Lin Wei;Shirota Riichiro;Mitiukhina Nina;Kuo Tsai-Hao |
分类号 |
H01L27/115 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
1. A NAND flash memory unit, comprising:
a string of memory cells connected in series; two source/drain (S/D) regions coupled to two terminals of the string of memory cells; at least one select transistor coupled between a terminal of the string and an S/D region, for selecting the string of memory cells; and at least one erase transistor coupled between the at least one select transistor and the one of the two S/D regions, wherein a voltage VCG is applied to gates of the memory cells, a voltage VS/D positively higher than the voltage VCG is applied to the S/D regions, a voltage VSG satisfying an inequality of “VSG<VS/D” is applied to a gate of the at least one select transistor, and a voltage VEG satisfying the inequality of “0V≦VEG<VS/D” is applied to the gate of the at least one erase transistor. |
地址 |
Miaoli TW |