发明名称 Method for epitaxial re-growth of semiconductor region
摘要 A treatment is performed on a surface of a first semiconductor region, wherein the treatment is performed using process gases including an oxygen-containing gas and an etching gas for etching the semiconductor material. An epitaxy is performed to grow a second semiconductor region on the surface of the first semiconductor region.
申请公布号 US8815712(B2) 申请公布日期 2014.08.26
申请号 US201213414357 申请日期 2012.03.07
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Wan Cheng-Tien;Lin You-Ru;Lee Yi-Jing;Wu Cheng-Hsien;Ko Chih-Hsin;Wann Clement Hsingjen
分类号 H01L21/36;H01L21/20 主分类号 H01L21/36
代理机构 Slater & Matsil, L.L.P. 代理人 Slater & Matsil, L.L.P.
主权项 1. A method comprising: forming Shallow Trench Isolation (STI) regions extending from a top surface of a semiconductor substrate into the semiconductor substrate; etching a portion of the semiconductor substrate between opposite sidewalls of the STI regions to form a recess; performing a treatment on a surface of the semiconductor substrate, with the surface being in the recess, wherein the treatment is performed using process gases comprising: an oxygen-containing gas; andan etching gas capable of etching the semiconductor substrate; performing an epitaxy to grow a second semiconductor region starting from the surface; and after the performing the epitaxy, recessing the STI regions.
地址 Hsin-Chu TW