发明名称 |
Method for epitaxial re-growth of semiconductor region |
摘要 |
A treatment is performed on a surface of a first semiconductor region, wherein the treatment is performed using process gases including an oxygen-containing gas and an etching gas for etching the semiconductor material. An epitaxy is performed to grow a second semiconductor region on the surface of the first semiconductor region. |
申请公布号 |
US8815712(B2) |
申请公布日期 |
2014.08.26 |
申请号 |
US201213414357 |
申请日期 |
2012.03.07 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Wan Cheng-Tien;Lin You-Ru;Lee Yi-Jing;Wu Cheng-Hsien;Ko Chih-Hsin;Wann Clement Hsingjen |
分类号 |
H01L21/36;H01L21/20 |
主分类号 |
H01L21/36 |
代理机构 |
Slater & Matsil, L.L.P. |
代理人 |
Slater & Matsil, L.L.P. |
主权项 |
1. A method comprising:
forming Shallow Trench Isolation (STI) regions extending from a top surface of a semiconductor substrate into the semiconductor substrate; etching a portion of the semiconductor substrate between opposite sidewalls of the STI regions to form a recess; performing a treatment on a surface of the semiconductor substrate, with the surface being in the recess, wherein the treatment is performed using process gases comprising:
an oxygen-containing gas; andan etching gas capable of etching the semiconductor substrate; performing an epitaxy to grow a second semiconductor region starting from the surface; and after the performing the epitaxy, recessing the STI regions. |
地址 |
Hsin-Chu TW |