发明名称 Integrated circuit memory device
摘要 A semiconductor memory device includes a plurality of memory regions formed on one chip, each of the memory regions having a plurality of volatile memory cells that are formed with a density or capacity of 2^K bits, where K is an integer greater than or equal to 0, and a plurality of input/output (I/O) terminals for inputting and outputting data of the volatile memory cells, and at least one peripheral region that controls a write operation for writing data into the memory regions and a read operation for reading data from the memory regions based on a command and an address input from outside. Thus, a total or entire density of the memory regions corresponds to a non-standard (or ‘interim’) density so that the semiconductor memory device may have an interim density.
申请公布号 US8817549(B2) 申请公布日期 2014.08.26
申请号 US201213478774 申请日期 2012.05.23
申请人 Samsung Electronics Co., Ltd. 发明人 Shin Choong-Sun;Choi Joo-Sun
分类号 G11C7/10 主分类号 G11C7/10
代理机构 Myers Bigel Sibley & Sajovec, PA 代理人 Myers Bigel Sibley & Sajovec, PA
主权项 1. A semiconductor memory device comprising: a plurality of memory regions formed on one chip, each of the memory regions having a plurality of volatile memory cells that are formed as a density of 2^K bits, where K is an integer greater than or equal to 0, and a plurality of input/output (I/O) terminals for inputting and outputting data of the volatile memory cells, an entire density of the memory regions corresponding to an interim density, wherein the memory regions include: a first memory region having a plurality of first volatile memory cells that are formed as a density of 2^M bits, where M is an integer greater than or equal to 0, and a plurality of first I/O terminals for inputting and outputting data of the first volatile memory cells; anda second memory region having a plurality of second volatile memory cells that are formed as a density of 2^N bits, where N is an integer greater than or equal to 0 and N is different from M, and a plurality of second I/O terminals for inputting and outputting data of the second volatile memory cells,wherein a number of the first I/O terminals and/or a number of the second I/O terminals can be expressed as 2^L, where L is an integer greater than or equal to 0, respectively; and at least one peripheral region configured to control a write operation for writing data into the memory regions and a read operation for reading data from the memory regions based on an externally input command and address.
地址 KR
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