发明名称 METHOD AND APPARATUS FOR SELF-TESTING TO IMPROVE FACTORY THROUGHPUT
摘要 A method and apparatus for self-testing of a radio frequency (RF) chipset is provided. The method requires that a set of test instructions be loaded into a software load station. Once the software is loaded, reference calibration is conducted with test equipment connected. After calibration, the test equipment is disconnected and self-testing of a transmit chain begins. A pre-determined load value is connected and the self-testing process routes a signal from the RF chipset internal modem through a power amplifier, duplexer, first coupler, switch, second coupler, and RF integrated circuit (IC). The apparatus includes a RF chipset that has an internal modem and signal generator as well as processors for processing self-testing of a transmit chain, self-testing of a primary receiver, and self-testing of a diversity receiver chain.
申请公布号 US2014233618(A1) 申请公布日期 2014.08.21
申请号 US201314037234 申请日期 2013.09.25
申请人 QUALCOMM Incorporated 发明人 KRISHNAN Sudarsan;IZOTOV Andrei V.
分类号 H04B17/00 主分类号 H04B17/00
代理机构 代理人
主权项 1. A method for self-testing a radio frequency (RF) chipset, comprising: loading a set of instructions into a software load station; conducting reference calibration with test equipment connected; disconnecting the test equipment and performing self-testing of a transmit chain with a predetermined load value connected, wherein the self-testing routes a signal from the RF chipset internal modem through a power amplifier, duplexer, first coupler, switch, second coupler, and radio frequency (RF) integrated circuit (IC) (WTR).
地址 San Diego CA US