发明名称 |
METHOD AND APPARATUS FOR SELF-TESTING TO IMPROVE FACTORY THROUGHPUT |
摘要 |
A method and apparatus for self-testing of a radio frequency (RF) chipset is provided. The method requires that a set of test instructions be loaded into a software load station. Once the software is loaded, reference calibration is conducted with test equipment connected. After calibration, the test equipment is disconnected and self-testing of a transmit chain begins. A pre-determined load value is connected and the self-testing process routes a signal from the RF chipset internal modem through a power amplifier, duplexer, first coupler, switch, second coupler, and RF integrated circuit (IC). The apparatus includes a RF chipset that has an internal modem and signal generator as well as processors for processing self-testing of a transmit chain, self-testing of a primary receiver, and self-testing of a diversity receiver chain. |
申请公布号 |
US2014233618(A1) |
申请公布日期 |
2014.08.21 |
申请号 |
US201314037234 |
申请日期 |
2013.09.25 |
申请人 |
QUALCOMM Incorporated |
发明人 |
KRISHNAN Sudarsan;IZOTOV Andrei V. |
分类号 |
H04B17/00 |
主分类号 |
H04B17/00 |
代理机构 |
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代理人 |
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主权项 |
1. A method for self-testing a radio frequency (RF) chipset, comprising:
loading a set of instructions into a software load station; conducting reference calibration with test equipment connected; disconnecting the test equipment and performing self-testing of a transmit chain with a predetermined load value connected, wherein the self-testing routes a signal from the RF chipset internal modem through a power amplifier, duplexer, first coupler, switch, second coupler, and radio frequency (RF) integrated circuit (IC) (WTR). |
地址 |
San Diego CA US |