发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To surely detect that a soft error has occurred while preventing an increase in a circuit size. ! SOLUTION: A memory chip 20 has a redundant address latch circuit 270 which retains a redundant address, and a redundant address comparison circuit 250 which compares the redundant address retained by the redundant address latch circuit 270 with an access address. A logic chip 10 has a redundant address latch circuit 170 which retains a redundant address, and a redundant address comparison circuit 150 which compares the redundant address retained by the redundant address latch circuit 170 with an access address. The logic chip 10 also has a HIT information comparison circuit 140 which compares a comparison result of the redundant address comparison circuit 150 with a comparison result of the redundant address comparison circuit 250, and performs error detection. ! COPYRIGHT: (C)2014,JPO&INPIT
申请公布号 JP2014149891(A) 申请公布日期 2014.08.21
申请号 JP20130018078 申请日期 2013.02.01
申请人 RENESAS ELECTRONICS CORP 发明人 JINBO TOSHIKATSU
分类号 G11C29/00 主分类号 G11C29/00
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