发明名称 Exposure apparatus and article manufacturing method
摘要 An apparatus for exposing a substrate to an energy in a vacuum includes a substrate stage having a mirror surface; a mirror configured to deflect a light into a Z axis direction; a measuring device configured to measure the stage position in the Z axis direction with the light in which the mirror surface is irradiated; a driving device configured to move the measuring device so that the mirror surface is irradiated with the light; an optical system configured to project the energy onto the substrate; and a cooling device including a radiation plate (arranged between the optical system and the stage in the Z axis direction and having a first opening which the energy passes and a second opening which the light passes), including a cooler configured to cool the first radiation plate, and configured to perform radiation cooling of the substrate.
申请公布号 US8810770(B2) 申请公布日期 2014.08.19
申请号 US201113157618 申请日期 2011.06.10
申请人 Canon Kabushiki Kaisha 发明人 Maehara Yuji;Korenaga Nobushige
分类号 G03B27/52;G03B27/58;G03B27/60 主分类号 G03B27/52
代理机构 Canon USA, Inc. IP Division 代理人 Canon USA, Inc. IP Division
主权项 1. An apparatus for exposing a substrate to an energy in a vacuum, the apparatus comprising: a stage having a mirror surface and configured to hold the substrate so that a surface of the substrate to be exposed is arranged along an X-Y plane; a mirror configured to deflect a light into a direction of a Z axis orthogonal to the X-Y plane; a measuring device configured to measure a position of the stage in the direction of the Z axis with the light in which the mirror surface is irradiated via the mirror; a first driving device configured to move the measuring device in accordance with a movement of the stage so that the mirror surface is irradiated with the light; an optical system configured to project the energy onto the substrate; a first cooling device including a first radiation plate which is arranged between the optical system and the stage in the direction of the Z axis and has a first opening which the energy passes and a second opening which the light moved in accordance with the movement of the measuring device passes, including a first cooler configured to cool the first radiation plate, and configured to perform radiation cooling of the substrate; and a second cooling device including a second radiation plate having a third opening which a light to be deflected by the mirror passes, including a second cooler configured to cool the second radiation plate, and configured to perform radiation cooling of the substrate via the mirror and the second opening.
地址 Tokyo JP