| 发明名称 | Impedance meter calibration | ||
| 摘要 | A method for verifying the adjustment for the purpose of calibration of an impedance meter having at least a first and a second measurement range includes measuring within the first range a first measured value of a test impedance; measuring within the second range a second measured value of the test impedance; and comparing the first and second measured values to verify the calibration of the impedance meter. | ||
| 申请公布号 | US8810256(B1) | 申请公布日期 | 2014.08.19 |
| 申请号 | US200812336896 | 申请日期 | 2008.12.17 |
| 申请人 | Keithley Instruments, Inc. | 发明人 | Goeke Wayne C. |
| 分类号 | G01R31/27 | 主分类号 | G01R31/27 |
| 代理机构 | Pearne & Gordon LLP | 代理人 | Pearne & Gordon LLP |
| 主权项 | 1. A method for verifying the adjustment for the purpose of calibration of an impedance meter having at least a first and a second impedance measurement range, said method comprising: measuring within said first impedance measurement range a first measured value of a test impedance; measuring within said second impedance measurement range a second measured value of said test impedance; and comparing said first and second measured values to verify the adjustment for the purpose of calibration of the impedance meter. | ||
| 地址 | Cleveland OH US | ||