发明名称 Semiconductor devices including bipolar transistors, CMOS transistors and DMOS transistors, and methods of manufacturing the same
摘要 Semiconductor devices having a bipolar transistor, a CMOS transistor, a drain extension MOS transistor and a double diffused MOS transistor are provided. The semiconductor device includes a semiconductor substrate including a logic region in which a logic device is formed and a high voltage region in which a high power device is formed, trenches in the semiconductor substrate, isolation layers in respective ones of the trenches, and at least one field insulation layer disposed at a surface of the semiconductor substrate in the high voltage region. Related methods are also provided.
申请公布号 US8809991(B2) 申请公布日期 2014.08.19
申请号 US201213707268 申请日期 2012.12.06
申请人 SK Hynix Inc. 发明人 Park Sung Kun
分类号 H01L21/8232;H01L27/088 主分类号 H01L21/8232
代理机构 William Park & Associates Patent Ltd. 代理人 William Park & Associates Patent Ltd.
主权项 1. A semiconductor device comprising: a semiconductor substrate including a logic region in which a logic device is formed and a high voltage region in which a high power device is formed; trenches in the semiconductor substrate; isolation layers in respective ones of the trenches; and at least one field insulation layer disposed at a surface of the semiconductor substrate in the high voltage region, wherein the at least one field insulation layer is a local oxidation of silicon (LOCOS) layer that includes a first portion extending into the semiconductor substrate and a second portion upwardly protruding from a top surface of the semiconductor substrate; wherein the first portion of the field insulation layer has a first thickness corresponding to about 40% of a total thickness of the field insulation layer; wherein the second portion of the field insulation layer has a second thickness corresponding to about 60% of the total thickness of the field insulation layer.
地址 Gyeonggi-do KR