发明名称 Structured light for 3D shape reconstruction subject to global illumination
摘要 Depth values in a scene are measured by projecting sets of patterns on the scene, wherein each set of patterns is structured with different spatial frequency using different encoding functions. Sets of images of the scene is acquired, wherein there is one image for each pattern in each set. Depth values are determining for each pixel at corresponding locations in the sets of images. The depth values of each pixel are analyzed, and the depth value is returned if the depth values at the corresponding locations are similar. Otherwise, the depth value is marked as having an error.
申请公布号 US8811767(B2) 申请公布日期 2014.08.19
申请号 US201113048019 申请日期 2011.03.15
申请人 Mitsubishi Electric Research Laboratories, Inc. 发明人 Veeraraghavan Ashok;Gupta Mohit;Agrawal Amit
分类号 G06K9/40;G06T7/00 主分类号 G06K9/40
代理机构 代理人 Brinkman Dirk;Vinokur Gene
主权项 1. A method for measuring depth values in a scene, comprising the steps of: projecting a plurality of sets of patterns on the scene, wherein each set is encoded with a different function, wherein each pattern in the set has different spatial frequency, and wherein the scene is subject to global illumination effects; acquiring a plurality of sets of images of the scene, wherein there is one image for each pattern in each set; determining, for each set of images, the depth value for each pixel at corresponding locations in the sets of images to produce a plurality of depth values for each pixel at the corresponding locations; comparing the plurality of depth values of each pixel at the corresponding locations, and returning the depth value if the plurality of depth values at the corresponding locations are similar, and otherwise marking the depth value as an error, wherein the steps are performed in a processor.
地址 Cambridge MA US