发明名称 APPARATUS, PROCESS, AND SYSTEM FOR MONITORING THE INTEGRITY OF CONTAINERS
摘要 <p>Apparatuses, systems, and methods to monitor the integrity of a container protected by a refractory material are disclosed having a first radiation detector to measure an external surface temperature of the container, a first radiation source to measure a thickness of the refractory material, and a central controller configured to display to a user the measurement of the external surface temperature of the container and the measurement of the thickness of the refractory material.</p>
申请公布号 KR20140100522(A) 申请公布日期 2014.08.14
申请号 KR20147016140 申请日期 2012.11.12
申请人 PROCESS METRIX 发明人 BONIN MICHEL PIERRE;HARVILL THOMAS LAWRENCE;HOOG JARED HUBERT
分类号 G01D21/02;G01B11/06;G01J5/60;G01N25/72 主分类号 G01D21/02
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