发明名称 |
APPARATUS, PROCESS, AND SYSTEM FOR MONITORING THE INTEGRITY OF CONTAINERS |
摘要 |
<p>Apparatuses, systems, and methods to monitor the integrity of a container protected by a refractory material are disclosed having a first radiation detector to measure an external surface temperature of the container, a first radiation source to measure a thickness of the refractory material, and a central controller configured to display to a user the measurement of the external surface temperature of the container and the measurement of the thickness of the refractory material.</p> |
申请公布号 |
KR20140100522(A) |
申请公布日期 |
2014.08.14 |
申请号 |
KR20147016140 |
申请日期 |
2012.11.12 |
申请人 |
PROCESS METRIX |
发明人 |
BONIN MICHEL PIERRE;HARVILL THOMAS LAWRENCE;HOOG JARED HUBERT |
分类号 |
G01D21/02;G01B11/06;G01J5/60;G01N25/72 |
主分类号 |
G01D21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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