发明名称 CORRECTION METHOD FOR OPTICAL DENSITY METER AND MANUFACTURING METHOD FOR SPECTACLE LENS
摘要 PROBLEM TO BE SOLVED: To make it possible to extremely easily and highly accurately correct a wavelength deviation caused between a plurality of optical density meters using a multiple wavelength spectroscope, without requiring additional equipment such as a light source for calibration.SOLUTION: In a correction method for an optical density meter, which corrects a wavelength deviation caused between a plurality of optical density meters 1a to 1e using a multiple wavelength spectroscope, a common band pass filter 20 is arranged on the optical path of the multiple wavelength spectroscope in each of the optical density meters 1a to 1e, and the spectral transmittances Da to De of the band pass filter are measured. Also, the wavelength deviations &Dgr;Wa to &Dgr;We between the center wavelengths λa to λe indicated by the corresponding spectral transmittance data Da to De measured using the common band pass filter 20 are corrected for the corresponding optical density meters 1a to 1e.
申请公布号 JP2014145664(A) 申请公布日期 2014.08.14
申请号 JP20130014446 申请日期 2013.01.29
申请人 HOYA CORP 发明人 YAMANOUCHI MASAHITO
分类号 G01J3/02;G01M11/00 主分类号 G01J3/02
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