发明名称 |
DIODE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a diode which is excellent in a voltage withstanding characteristics and an oscillation characteristics and has a low loss.SOLUTION: In an Si wafer having a thickness from 340 to 380 μm, an n-buffer (nB) layer is formed by diffusing an n-type dopant having dosage of from 5×10to 1×10cmin a range of from 50 to 130 μm in depth. |
申请公布号 |
JP2014146721(A) |
申请公布日期 |
2014.08.14 |
申请号 |
JP20130014959 |
申请日期 |
2013.01.30 |
申请人 |
HITACHI POWER SEMICONDUCTOR DEVICE LTD |
发明人 |
WAKAGI MASATOSHI;TOYODA YOSHIAKI |
分类号 |
H01L29/868;H01L21/329;H01L29/861 |
主分类号 |
H01L29/868 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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