发明名称 RESPONSE TO TAMPER DETECTION IN A MEMORY DEVICE
摘要 In response to a tamper-attempt indication, a memory device selectively disables one or more memory operations. Disabling can be accomplished by different techniques, including altering bias voltages associated with performing the memory operation, gating off a current needed for performing the memory operation, and limiting the needed current to a magnitude below the threshold magnitude required for the operation. After disabling the memory operation, a mock current can be generated. The mock current is intended to mimic the current normally expended during the memory operation when not disabled, thereby leading a user to believe that the device is continuing to operate normally even though the memory operation that is being attempted is not actually being performed.
申请公布号 US2014230079(A1) 申请公布日期 2014.08.14
申请号 US201414175063 申请日期 2014.02.07
申请人 Everspin Technologies, Inc. 发明人 Alam Syed M.;Andre Thomas
分类号 G06F21/78 主分类号 G06F21/78
代理机构 代理人
主权项 1. A method comprising: detecting a tamper-attempt indication corresponding to a memory device that includes an array of memory cells; and disabling a memory operation within the memory device based on the tamper-attempt indication received, wherein the disabling includes adjusting a voltage corresponding to circuitry on the memory device used in the memory operation such that the memory operation is disabled.
地址 Chandler AZ US