发明名称 |
RESPONSE TO TAMPER DETECTION IN A MEMORY DEVICE |
摘要 |
In response to a tamper-attempt indication, a memory device selectively disables one or more memory operations. Disabling can be accomplished by different techniques, including altering bias voltages associated with performing the memory operation, gating off a current needed for performing the memory operation, and limiting the needed current to a magnitude below the threshold magnitude required for the operation. After disabling the memory operation, a mock current can be generated. The mock current is intended to mimic the current normally expended during the memory operation when not disabled, thereby leading a user to believe that the device is continuing to operate normally even though the memory operation that is being attempted is not actually being performed. |
申请公布号 |
US2014230079(A1) |
申请公布日期 |
2014.08.14 |
申请号 |
US201414175063 |
申请日期 |
2014.02.07 |
申请人 |
Everspin Technologies, Inc. |
发明人 |
Alam Syed M.;Andre Thomas |
分类号 |
G06F21/78 |
主分类号 |
G06F21/78 |
代理机构 |
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代理人 |
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主权项 |
1. A method comprising:
detecting a tamper-attempt indication corresponding to a memory device that includes an array of memory cells; and disabling a memory operation within the memory device based on the tamper-attempt indication received, wherein the disabling includes adjusting a voltage corresponding to circuitry on the memory device used in the memory operation such that the memory operation is disabled. |
地址 |
Chandler AZ US |