| 发明名称 |
MOTION ANALYSIS APPARATUS AND MOTION ANALYSIS METHOD |
| 摘要 |
A motion analysis apparatus includes: a threshold value determining section that determines whether the amount of inertia in a first period is within a threshold value range; a bias value setting section that sets, if it is determined that the amount of inertia is within the threshold value range, a bias value included in the amount of inertia on the basis of a first average value that is an average value of the amount of inertia detected in the first period; and an analysis information calculating section that analyzes a motion of a measurement object using correction data from which the bias value is removed. |
| 申请公布号 |
US2014229135(A1) |
申请公布日期 |
2014.08.14 |
| 申请号 |
US201414176468 |
申请日期 |
2014.02.10 |
| 申请人 |
Seiko Epson Corporation |
发明人 |
Nomura Kazuo |
| 分类号 |
G01P21/00 |
主分类号 |
G01P21/00 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A motion analysis apparatus comprising:
a threshold value determining section that determines whether the amount of inertia detected by an inertial sensor in a first period is within a threshold value range; a bias value setting section that sets, if it is determined that the amount of inertia is within the threshold value range, a bias value included in the amount of inertia on the basis of a first average value that is an average value of the amount of inertia detected in the first period; and an analysis information calculating section that analyzes a motion of a measurement object using correction data from which the bias value is removed. |
| 地址 |
Tokyo JP |
