| 摘要 |
A system (100) for generating an image of contoured surface (50) includes a light source (120) that is configured to project an electromagnetic radiation beam (126) onto the contoured surface, wherein the projected beam generates first radiation (128) reflected from a first portion of the contoured surface to form a speckle pattern, and second radiation (128) reflected from a second portion of the contoured surface which is substantially uniform in intensity. The reflected first and second reflected radiation is received by an optical detector (135), and may be processed. The processing is configured to (1) generate a plurality of images from the first and second reflected radiation, with each image being generated using different coherence length electromagnetic radiation from the light source, and (2) generate a 3-D image (170) of the contoured surface from the plurality of images. Methods for generating a 3-D image of a contoured surface are also disclosed. |
