| 摘要 |
<p>A set of test requests, a test calendar, and a list of prototype control models are received in a computing device having a processor and a memory. Each of the test requests includes an identifier for one of a plurality of tests to be performed and one or more attributes required to be included in a prototype to be used in the one of the tests. The test calendar includes a test duration and a list of build dates, each of the build dates associated with one of a plurality of prototypes to be available for testing on the respective build date. The list of prototype control models includes a list of possible buildable configurations of the prototypes. A control model compatibility list is generated, including, for each pair of prototypes in the plurality of prototypes, an indication of whether the prototypes in the pair are compatible for tests. A test schedule is generated using at least one of a heuristic and a mathematical optimization.</p> |
