| 发明名称 | Contactless measuring system for near field measurement of a signal waveguide | ||
| 摘要 | A contactless measuring system having at least one test probe forming part of a coupling structure for the contactless decoupling of a signal running on a signal waveguide, wherein the signal waveguide is designed as a conductor of the electric circuit on a circuit board and as part of an electric circuit. To this end, at least one contact structure is configured and disposed on the circuit board such that said contact structure is galvanically separated from the signal waveguide, forms part of the coupling structure, is displaced completely within the near field of the signal waveguide, and has at least one contact point, which may be electrically contacted by a contact of the test probe. | ||
| 申请公布号 | US8803538(B2) | 申请公布日期 | 2014.08.12 |
| 申请号 | US200812671848 | 申请日期 | 2008.07.24 |
| 申请人 | Rosenberger Hochfrequenztechnik GmbH & Co. KG | 发明人 | Zelder Thomas |
| 分类号 | G01R31/20;G01R27/32;G01R31/312;G01R31/28;G01R1/24;G01R35/00;G01R31/315 | 主分类号 | G01R31/20 |
| 代理机构 | DeLio, Peterson & Curcio, LLC | 代理人 | Curcio Robert;DeLio, Peterson & Curcio, LLC |
| 主权项 | 1. A contactless measuring system comprising at least one test probe forming part of a coupling structure for contactless decoupling of a signal running on a signal waveguide, wherein said signal waveguide is configured as a conductor track and as part of an electrical circuit on a circuit board, such that at least one contact structure is configured and arranged on the circuit board, galvanically separated from the signal waveguide, forming part of the coupling structure, arranged completely within a near field of the signal waveguide, and comprising at least one contact point which can be electrically contacted by a contact of said at least one test probe. | ||
| 地址 | Fridolfing DE | ||