Estimating wear of non-volatile, solid state memory

摘要

Completion times of data storage operations targeted to a non-volatile, solid-state memory device are measured. Wear of the memory device is estimated using the measured completion times, and life cycle management operations are performed to affect subsequent wear of the memory device in accordance with the estimated wear. The life cycle management may include operations such as wear leveling, predicting an end of service life of the memory device, and removing worn blocks of the memory device from service.

主权项

1. An apparatus comprising:
a controller capable of being coupled to a non-volatile, solid-state memory device, the controller configured to cause the apparatus to:
measure completion times of data storage operations targeted to the memory device;compare an average and a confidence interval of the measured completion times with a baseline average and a baseline confidence interval of baseline completion times for other equivalent memory devices to estimate wear of the memory device; andperform life cycle management operations to affect subsequent wear of the memory device in accordance with the estimated wear.