发明名称 Variable resistance memory device and method of fabricating the same
摘要 According to an example embodiment, a variable resistance memory device includes a lower electrode that includes a spacer-shaped first sub lower electrode and a second sub lower electrode covering a curved sidewall of the first sub lower electrode. The second sub lower electrode extends upward to protrude above the top of the first sub lower electrode. The lower electrode includes an upward-tapered shape.
申请公布号 US8804400(B2) 申请公布日期 2014.08.12
申请号 US201213469740 申请日期 2012.05.11
申请人 Samsung Electronics Co., Ltd. 发明人 Hong Sanghyun;Lee Jaekyu;Kim Yong Kwan
分类号 G11C11/00;H01L47/00 主分类号 G11C11/00
代理机构 Harness, Dickey & Pierce, P.L.C. 代理人 Harness, Dickey & Pierce, P.L.C.
主权项 1. A variable resistance memory device, comprising: a word line; a bit line crossing over the word line; a selection device between the word line and the bit line, a lower electrode between the selection device and the bit line, the lower electrode including, a first sub lower electrode having an upward-tapered spacer shape, and a second sub lower electrode covering a sidewall of the first sub lower electrode and protruding above a top of the first sub lower electrode, and a variable resistance pattern between the lower electrode and the bit line.
地址 Gyeonggi-Do KR