发明名称 |
SEMICONDUCTOR LIGHT EMITTING ELEMENT, AND MANUFACTURING METHOD FOR SEMICONDUCTOR LIGHT EMITTING ELEMENT |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor light emitting element that permits generation of penetration dislocation caused in a single crystal film formed on a substrate and that uses a group III nitride semiconductor with satisfactory light emission characteristics.SOLUTION: A semiconductor light emitting element comprises: n-type semiconductor layers 141 and 142 arranged in layers on a substrate; a light emitting layer of a multiquantum well structure, in which barrier layers 151 and well layers 152 containing In atoms are alternately arranged in layers; and p-type semiconductor layers 160 (161, 162). The light emitting layer comprises: three or more well layers; and four or more barrier layers connected to the n-type semiconductor layers and p-type semiconductor layers while sandwiching them from both sides. Each well layer comprises: a plurality of n-side well layers provided in order from the side close to the n-type semiconductor layers; and one p-side well layer on the side close to the p-type semiconductor layers. The light emitting layer has a V-shaped recessed part 150V formed from recessed inclining faces, which is open on the p-type semiconductor layer side. The concentration of In atoms in the inclining faces of at least one or more n-side well layers is 50% or less than the concentration of In atoms present in the n-side well layers. |
申请公布号 |
JP2014143358(A) |
申请公布日期 |
2014.08.07 |
申请号 |
JP20130012242 |
申请日期 |
2013.01.25 |
申请人 |
TOYODA GOSEI CO LTD |
发明人 |
KUSUKI KATSUTERU;SATO TOSHIAKI |
分类号 |
H01L33/32;H01L21/205;H01L33/06 |
主分类号 |
H01L33/32 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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