发明名称 |
Method for Producing a Semiconductor Device with a Vertical Dielectric Layer |
摘要 |
A method for producing a semiconductor device is disclosed. The method includes providing a semiconductor body having a first surface, and a second surface opposite the first surface, producing a first trench having a bottom and sidewalls and extending from the first surface into the semiconductor body, forming a dielectric layer along at least one sidewall of the trench, and filling the trench with a filling material. Forming the dielectric layer includes forming a protection layer on the least one sidewall such that the protection layer leaves a section of the at least one sidewall uncovered, oxidizing the semiconductor body in the region of the uncovered sidewall section to form a first section of the dielectric layer, removing the protection layer, and forming a second section of the dielectric layer on the at least one sidewall. |
申请公布号 |
US2014220758(A1) |
申请公布日期 |
2014.08.07 |
申请号 |
US201313760446 |
申请日期 |
2013.02.06 |
申请人 |
INFINEON TECHNOLOGIES AUSTRIA AG |
发明人 |
Mauder Anton;Hirler Franz;Meiser Andreas |
分类号 |
H01L49/02 |
主分类号 |
H01L49/02 |
代理机构 |
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代理人 |
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主权项 |
1. A method for producing a semiconductor device, comprising:
providing a semiconductor body having a first surface; producing a first trench having a bottom and sidewalls and extending from the first surface into the semiconductor body; forming a dielectric layer along at least one sidewall of the trench; and filling the trench with a filling material, wherein forming the dielectric layer comprises:
forming a protection layer on the least one sidewall such that the protection layer leaves a section of the at least one sidewall uncovered;oxidizing the semiconductor body in the region of the uncovered sidewall section to form a first section of the dielectric layer;removing the protection layer; andforming a second section of the dielectric layer on the at least one sidewall. |
地址 |
Villach AT |