发明名称 IMAGE RECONSTRUCTION BASED ON PARAMETRIC MODELS
摘要 Systems and methods for modeling are provided. The method can include acquiring scan data associated with a plurality of x-ray projections of an item. The method can further include determining at least one closed boundary curve associated with the item. For example, the method can determine a first maximum area based on the scan data and determine at least one edge of the first maximum area. The method can further generate a model of the item using the closed boundary curve and a first material specific parameter for a material within the closed boundary curve. The method can utilize the model to generate computed scan data, compare the computed scan data to the scan data, and determine a goodness of fit. The method can further adjust the model of the item by altering at least one of the closed boundary curve and the material specific parameter.
申请公布号 US2014222385(A1) 申请公布日期 2014.08.07
申请号 US201214000907 申请日期 2012.02.23
申请人 Muenster Matthias;Dreiseitel Pia 发明人 Muenster Matthias;Dreiseitel Pia
分类号 G06F17/50 主分类号 G06F17/50
代理机构 代理人
主权项 1. A method of modeling comprising: acquiring scan data, wherein the scan data comprises data associated with a plurality of x-ray projections of an item; and determining at least one closed boundary curve associated with the item comprising: determining a first maximum area based on the data associated with the plurality of x-ray projections;determining at least one edge of the first maximum area;generating a model of the item using the at least one closed boundary curve and a set of material specific parameters comprising at least a first material specific parameter for a material within the closed boundary curve, utilizing the model to generate computed scan data and comparing the computed scan data to the scan data, determining a goodness of fit, andadjusting the model of the item by altering at least one of the set of: the at least one closed boundary curve and the set of material specific parameters comprising at least the first material specific parameter.
地址 Wiesbaden DE