发明名称 |
IMAGE RECONSTRUCTION BASED ON PARAMETRIC MODELS |
摘要 |
Systems and methods for modeling are provided. The method can include acquiring scan data associated with a plurality of x-ray projections of an item. The method can further include determining at least one closed boundary curve associated with the item. For example, the method can determine a first maximum area based on the scan data and determine at least one edge of the first maximum area. The method can further generate a model of the item using the closed boundary curve and a first material specific parameter for a material within the closed boundary curve. The method can utilize the model to generate computed scan data, compare the computed scan data to the scan data, and determine a goodness of fit. The method can further adjust the model of the item by altering at least one of the closed boundary curve and the material specific parameter. |
申请公布号 |
US2014222385(A1) |
申请公布日期 |
2014.08.07 |
申请号 |
US201214000907 |
申请日期 |
2012.02.23 |
申请人 |
Muenster Matthias;Dreiseitel Pia |
发明人 |
Muenster Matthias;Dreiseitel Pia |
分类号 |
G06F17/50 |
主分类号 |
G06F17/50 |
代理机构 |
|
代理人 |
|
主权项 |
1. A method of modeling comprising:
acquiring scan data, wherein the scan data comprises data associated with a plurality of x-ray projections of an item; and determining at least one closed boundary curve associated with the item comprising:
determining a first maximum area based on the data associated with the plurality of x-ray projections;determining at least one edge of the first maximum area;generating a model of the item using the at least one closed boundary curve and a set of material specific parameters comprising at least a first material specific parameter for a material within the closed boundary curve, utilizing the model to generate computed scan data and comparing the computed scan data to the scan data, determining a goodness of fit, andadjusting the model of the item by altering at least one of the set of: the at least one closed boundary curve and the set of material specific parameters comprising at least the first material specific parameter. |
地址 |
Wiesbaden DE |