发明名称 METAL INTERCONNECT STRUCTURE OF A SEMICONDUCTOR DEVICE AND METHOD FOR FORMING THE SAME
摘要 A wire structure of a semiconductor device and a method for forming the same are provided. The wire structure of a semiconductor device comprises: a lower film having a lower wire; an interlayer insulating film having a contact hole exposing one part of the lower wire, and a trench extended along a first direction and connected with the contact hole; a contact plug filled in the contact hole of the interlayer insulating film; and an upper wire in the trench of the interlayer insulating film, which is connected with the contact plug, wherein the contact plug has a lower side wall having a first slope against the lower film in a first direction, and an upper side wall having a second slope against the lower film. The second slope may be smaller than the first slope.
申请公布号 KR20140096874(A) 申请公布日期 2014.08.06
申请号 KR20130010018 申请日期 2013.01.29
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KANG, MIN SUNG
分类号 H01L21/28 主分类号 H01L21/28
代理机构 代理人
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