发明名称 Actinic ray-sensitive or radiation-sensitive resin composition and pattern forming method using the composition
摘要 Provided is an actinic ray-sensitive or radiation-sensitive resin composition including: (A) a resin capable of increasing the solubility in an alkali developer by the action of an acid, (B) a compound capable of generating an acid upon irradiation with an actinic ray or radiation, and (C) a resin which contains (c) a repeating unit having at least one polarity conversion group and has at least either a fluorine atom or a silicon atom.
申请公布号 US8795944(B2) 申请公布日期 2014.08.05
申请号 US200913139193 申请日期 2009.12.11
申请人 FUJIFILM Corporation 发明人 Saegusa Hiroshi;Iwato Kaoru;Hirano Shuji;Iizuka Yusuke
分类号 G03F7/004;G03F7/028;G03F7/039;G03F7/26 主分类号 G03F7/004
代理机构 Sughrue Mion, PLLC 代理人 Sughrue Mion, PLLC
主权项 1. An actinic ray-sensitive or radiation-sensitive resin composition comprising: (A) a resin capable of increasing the solubility in an alkali developer by the action of an acid, (B) a compound capable of generating an acid upon irradiation with an actinic ray or radiation, and (C) a resin which contains (c) a repeating unit having at least one polarity conversion group and has at least either a fluorine atom or a silicon atom, wherein the repeating unit (c) has at least either a fluorine atom or a silicon atom; and wherein: (i) the repeating unit (c) is (c′) repeating unit having a fluorine atom and a polarity conversion group on one side chain; (ii) the resin (A) contains no fluorine atom and no silicon atom; and (iii) the amount of the resin (A) is 70 to 98 mass% based on the entire solids content of the resin composition.
地址 Tokyo JP