发明名称 Printed non-volatile memory
摘要 A nonvolatile memory cell is disclosed, having first and second semiconductor islands at the same horizontal level and spaced a predetermined distance apart, the first semiconductor island providing a control gate and the second semiconductor island providing source and drain terminals; a gate dielectric layer on at least part of the first semiconductor island; a tunneling dielectric layer on at least part of the second semiconductor island; a floating gate on at least part of the gate dielectric layer and the tunneling dielectric layer; and a metal layer in electrical contact with the control gate and the source and drain terminals. In one advantageous embodiment, the nonvolatile memory cell may be manufactured using an “all-printed” process technology.
申请公布号 US8796774(B2) 申请公布日期 2014.08.05
申请号 US201213585673 申请日期 2012.08.14
申请人 Thin Film Electronics ASA 发明人 Kamath Arvind;Smith Patrick;Cleeves James Montague
分类号 H01L29/66;H01L29/788 主分类号 H01L29/66
代理机构 Murabito Hao & Barnes LLP 代理人 Fortney Andrew D.;Murabito Hao & Barnes LLP
主权项 1. A non-volatile memory cell, comprising: a) first and second semiconductor islands at a same horizontal level on a substrate and spaced a predetermined distance apart, the first semiconductor island comprising a control gate of said non-volatile memory cell and the second semiconductor island comprising source and drain terminals of said non-volatile memory cell; b) a gate dielectric layer on at least part of said first semiconductor island; c) a tunneling dielectric layer on at least part of said second semiconductor island; d) a floating gate on at least part of said gate dielectric layer and said tunneling dielectric layer; and e) a metal layer in electrical contact with said control gate and said source and drain terminals.
地址 Oslo NO