发明名称 Method for processing images obtained by tomosynthesis and associated device
摘要 A processing method for images obtained by tomosynthesis comprising acquisition of a plurality of 2D projection images of a region of interest of a patient; reconstruction of a 3D digital image from the acquired 2D projection images. An embodiment of the method is characterized in that it comprises: detection of an object in the reconstructed 3D image; estimation of a thickness limit characteristic of a contrast default of the voxels for a diameter of the object; estimation of the thickness of the object; comparison of the thickness of the object to the thickness limit; and in that if the thickness of the object is less than the thickness limit, the method further comprises application at least to the voxels of the object in the reconstructed image of a multiplicative corrective factor equal to the ratio between the thickness limit and the thickness of the object.
申请公布号 US8798348(B2) 申请公布日期 2014.08.05
申请号 US200912371968 申请日期 2009.02.17
申请人 General Electric Company 发明人 Muller Serge;Puong Sylvie
分类号 G06K9/00 主分类号 G06K9/00
代理机构 Global Patent Operation 代理人 Global Patent Operation ;Vivenzio Marc A.
主权项 1. A method for processing contrast-enhanced images obtained by a tomosynthesis apparatus, the method comprising: acquiring a plurality of 2D projection contrast-enhanced images of a region of interest of a patient; reconstructing a digital 3D image from the acquired 2D projection contrast-enhanced images; detecting an object in the reconstructed 3D image; estimating a thickness limit characteristic of a contrast default of voxels for a diameter of the object; estimating the thickness of the object; and comparing the thickness of the object to the thickness limit, wherein if the thickness of the object is less than the thickness limit, the method further comprises: applying at least to the voxels of the object in the reconstructed 3D image a multiplicative corrective factor equal to the ratio between the thickness limit and the thickness of the object to thus proportionally relate the thickness of the object and the thickness limit for a known geometry of the tomosynthesis apparatus.
地址 Schenectady NY US