发明名称 |
FORMING STRUCTURES ON RESISTIVE SUBSTRATES |
摘要 |
A substrate includes a first region having a first resistivity, for optimizing a field effect transistor, a second region having a second resistivity, for optimizing an npn subcollector of a bipolar transistor device and triple well, a third region having a third resistivity, with a high resistivity for a passive device, a fourth region, substantially without implantation, to provide low perimeter capacitance for devices. |
申请公布号 |
US2014213036(A1) |
申请公布日期 |
2014.07.31 |
申请号 |
US201414230206 |
申请日期 |
2014.03.31 |
申请人 |
International Business Machines Corporation |
发明人 |
Botula Alan B.;Camillo-Castillo Renata;Dunn James S.;Gambino Jeffrey P.;Hershberger Douglas B.;Joseph Alvin J.;Rassel Robert M.;Stidham Mark E. |
分类号 |
H01L21/762 |
主分类号 |
H01L21/762 |
代理机构 |
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代理人 |
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主权项 |
1. A method for fabricating a substrate, the method comprising:
implanting p-type ions in a first region of the substrate that decrease the resistivity of the first region; implanting n-type ions in a second region of the substrate; implanting argon ions in a third region of the substrate that decrease carrier mobility of the third region of the substrate. |
地址 |
Armonk NY US |