发明名称 FORMING STRUCTURES ON RESISTIVE SUBSTRATES
摘要 A substrate includes a first region having a first resistivity, for optimizing a field effect transistor, a second region having a second resistivity, for optimizing an npn subcollector of a bipolar transistor device and triple well, a third region having a third resistivity, with a high resistivity for a passive device, a fourth region, substantially without implantation, to provide low perimeter capacitance for devices.
申请公布号 US2014213036(A1) 申请公布日期 2014.07.31
申请号 US201414230206 申请日期 2014.03.31
申请人 International Business Machines Corporation 发明人 Botula Alan B.;Camillo-Castillo Renata;Dunn James S.;Gambino Jeffrey P.;Hershberger Douglas B.;Joseph Alvin J.;Rassel Robert M.;Stidham Mark E.
分类号 H01L21/762 主分类号 H01L21/762
代理机构 代理人
主权项 1. A method for fabricating a substrate, the method comprising: implanting p-type ions in a first region of the substrate that decrease the resistivity of the first region; implanting n-type ions in a second region of the substrate; implanting argon ions in a third region of the substrate that decrease carrier mobility of the third region of the substrate.
地址 Armonk NY US