| 发明名称 |
MULTILAYER CERAMIC CAPACITOR |
| 摘要 |
With a multilayer ceramic capacitor whose average grain size of the dielectric grains present at the outermost layer position P1 in the laminate is given by D1, average grain size of the dielectric grains present at the center position P2 in the laminate is given by D2, and average grain size of the dielectric grains present at the 25%-penetrated position P3 which is a position penetrated into the laminate by 25% is given by D3, growth of the dielectric grains occurring as a result of sintering is partially suppressed in such a way that the relationships of average grain sizes D1, D2, and D3 satisfy the conditions of 1.5×D1<D3 and 1.2×D2<D3. This way, a sufficient CR product can be obtained even with a dielectric thickness of 1 μm or less. |
| 申请公布号 |
US2014211367(A1) |
申请公布日期 |
2014.07.31 |
| 申请号 |
US201314066465 |
申请日期 |
2013.10.29 |
| 申请人 |
Taiyo Yuden Co., Ltd. |
发明人 |
MORITA Koichiro;TANIGUCHI Katsuya |
| 分类号 |
H01G4/30 |
主分类号 |
H01G4/30 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A multilayer ceramic capacitor with a laminate constituted by dielectric layers alternately laminated with internal electrode layers, said multilayer ceramic capacitor satisfies conditions of 1.5×D1<D3 and 1.2×D2<D3 as relationships of grain sizes D1, D2 and D3, where D1 represents an average grain size of dielectric grains present at an outermost layer position in the laminate in a laminating direction, D2 represents an average grain size of dielectric grains present at a center position in the laminate in the laminating direction, and D3 represents an average grain size of dielectric grains present at an intermediate position equidistant from the outermost layer position and the center position in the laminate in the laminating direction. |
| 地址 |
Tokyo JP |
