发明名称 |
(Al,Ga,In)N diode laser fabricated at reduced temperature |
摘要 |
A method of fabricating an (Al,Ga,In)N laser diode, comprising depositing one or more III-N layers upon a growth substrate at a first temperature, depositing an indium containing laser core at a second temperature upon layers deposited at a first temperature, and performing all subsequent fabrication steps under conditions that inhibit degradation of the laser core, wherein the conditions are a substantially lower temperature than the second temperature. |
申请公布号 |
US8790943(B2) |
申请公布日期 |
2014.07.29 |
申请号 |
US201213593340 |
申请日期 |
2012.08.23 |
申请人 |
The Regents of the University of California |
发明人 |
Cohen Daniel A.;DenBaars Steven P.;Nakamura Shuji |
分类号 |
H01S5/343;H01L33/32 |
主分类号 |
H01S5/343 |
代理机构 |
Gates & Cooper LLP |
代理人 |
Gates & Cooper LLP |
主权项 |
1. A method of fabricating an (Al,Ga,In)N laser diode, comprising
fabricating an indium containing laser core; and fabricating subsequent layers on or above the laser core that function at least as a waveguide or cladding layer; wherein the subsequent layers fabricated on or above the laser core comprise a crystalline, polycrystalline or amorphous transparent conducting oxide grown or deposited on or above the laser core; and wherein the indium containing laser core is fabricated at a first temperature, and the subsequent lavers are grown or deposited on or above the laser core at or below a second temperature that is lower than the first temperature, to inhibit degradation of the laser core. |
地址 |
Oakland CA US |