发明名称 |
Tracking and characterizing particles with holographic video microscopy |
摘要 |
In-line holography to create images of a specimen, such as one or more particles dispersed in a transparent medium. Analyzing these images with results from light scattering theory yields the particles' sizes with nanometer resolution, their refractive indexes to within one part in a thousand, and their three dimensional positions with nanometer resolution. This procedure can rapidly and directly characterize mechanical, optical and chemical properties of the specimen and its medium. |
申请公布号 |
US8791985(B2) |
申请公布日期 |
2014.07.29 |
申请号 |
US200812740628 |
申请日期 |
2008.10.30 |
申请人 |
New York University |
发明人 |
Grier David G.;Lee Sang-Hyuk;Cheong Fook C. |
分类号 |
H04N5/89;G03H1/00;G01P5/20;G01P5/00;G01N15/14;G01N15/02;G03H1/04;G03H1/08;G01N15/00 |
主分类号 |
H04N5/89 |
代理机构 |
Foley & Lardner LLP |
代理人 |
Foley & Lardner LLP |
主权项 |
1. A method for characterizing a specimen, comprising:
providing a holographic microscope; providing a collimated laser beam to the holographic microscope; scattering the collimated laser beam off the specimen to generate a scattered portion; generating an on-axis hologram including an interference pattern from an unscattered portion of the collimated laser beam and the scattered portion; recording the interference pattern for subsequent analysis wherein the step of recording the interference pattern includes a step of normalizing the interference pattern by dividing the interference pattern by a background form of interference pattern wherein the background form is selected from the group of a previously recorded background image form, a normalization constant form and a numerical model for a background illumination pattern form, and the normalized interference pattern is selectively fitted to a particular prediction methodology of light scattering, thereby providing characteristic information about the specimen; and using the characteristic information for measuring at least one of a spatial location, a mechanical property, an optical property and a chemical property of the specimen. |
地址 |
New York NY US |