发明名称 Tracking and characterizing particles with holographic video microscopy
摘要 In-line holography to create images of a specimen, such as one or more particles dispersed in a transparent medium. Analyzing these images with results from light scattering theory yields the particles' sizes with nanometer resolution, their refractive indexes to within one part in a thousand, and their three dimensional positions with nanometer resolution. This procedure can rapidly and directly characterize mechanical, optical and chemical properties of the specimen and its medium.
申请公布号 US8791985(B2) 申请公布日期 2014.07.29
申请号 US200812740628 申请日期 2008.10.30
申请人 New York University 发明人 Grier David G.;Lee Sang-Hyuk;Cheong Fook C.
分类号 H04N5/89;G03H1/00;G01P5/20;G01P5/00;G01N15/14;G01N15/02;G03H1/04;G03H1/08;G01N15/00 主分类号 H04N5/89
代理机构 Foley & Lardner LLP 代理人 Foley & Lardner LLP
主权项 1. A method for characterizing a specimen, comprising: providing a holographic microscope; providing a collimated laser beam to the holographic microscope; scattering the collimated laser beam off the specimen to generate a scattered portion; generating an on-axis hologram including an interference pattern from an unscattered portion of the collimated laser beam and the scattered portion; recording the interference pattern for subsequent analysis wherein the step of recording the interference pattern includes a step of normalizing the interference pattern by dividing the interference pattern by a background form of interference pattern wherein the background form is selected from the group of a previously recorded background image form, a normalization constant form and a numerical model for a background illumination pattern form, and the normalized interference pattern is selectively fitted to a particular prediction methodology of light scattering, thereby providing characteristic information about the specimen; and using the characteristic information for measuring at least one of a spatial location, a mechanical property, an optical property and a chemical property of the specimen.
地址 New York NY US