发明名称 CALIBRATION STANDARD MEMBER AND MANUFACTURING METHOD THEREFOR AND CALIBRATION METHOD USING THE SAME
摘要 <p>PROBLEM TO BE SOLVED: To provide a calibration standard member which allows for high accuracy astigmatism adjustment used in a charged particle beam device.SOLUTION: A calibration standard member 16 for calibrating the aberration of a charged particle beam device in which a charged particle beam scans on the surface of a sample by deflection has, as a calibration pattern 3 for calibrating the aberration of a charged particle beam, a plurality of patterns composed of a silicon layer 11 extending in one direction and a molybdenum layer 12 in the same plane, and a part of the pattern is curved.</p>
申请公布号 JP2014137872(A) 申请公布日期 2014.07.28
申请号 JP20130005095 申请日期 2013.01.16
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 NAKAYAMA YOSHINORI ; HATANO MICHIO ; FUKAYA RITSUO ; WANG JIKANG ; HAYATA YASUNARI ; YAMAMOTO JIRO
分类号 H01J37/20;H01J9/14 主分类号 H01J37/20
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