发明名称 |
CALIBRATION STANDARD MEMBER AND MANUFACTURING METHOD THEREFOR AND CALIBRATION METHOD USING THE SAME |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a calibration standard member which allows for high accuracy astigmatism adjustment used in a charged particle beam device.SOLUTION: A calibration standard member 16 for calibrating the aberration of a charged particle beam device in which a charged particle beam scans on the surface of a sample by deflection has, as a calibration pattern 3 for calibrating the aberration of a charged particle beam, a plurality of patterns composed of a silicon layer 11 extending in one direction and a molybdenum layer 12 in the same plane, and a part of the pattern is curved.</p> |
申请公布号 |
JP2014137872(A) |
申请公布日期 |
2014.07.28 |
申请号 |
JP20130005095 |
申请日期 |
2013.01.16 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORP |
发明人 |
NAKAYAMA YOSHINORI ; HATANO MICHIO ; FUKAYA RITSUO ; WANG JIKANG ; HAYATA YASUNARI ; YAMAMOTO JIRO |
分类号 |
H01J37/20;H01J9/14 |
主分类号 |
H01J37/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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