发明名称 ABNORMAL MEASURING INSTRUMENT DETERMINATION SYSTEM
摘要 PROBLEM TO BE SOLVED: To appropriately detect abnormality of a measuring instrument and to spread information of inspection and failures to a plant operator at more suitable time.SOLUTION: In an abnormality measuring instrument determination system for measuring the same quantity to be measured in a plant by a first measuring instrument 100 and a second measuring instrument 200, comparing a measurement output of the first measuring instrument 100 with a measurement output of the second measuring instrument 200 and determining abnormality of the measuring instruments, the abnormality of the measuring instruments is determined depending on a difference between a change rate of measurement outputs of the first measuring instrument 100 and a change rate of the measurement outputs of the second measuring instrument 200.
申请公布号 JP2014137659(A) 申请公布日期 2014.07.28
申请号 JP20130005077 申请日期 2013.01.16
申请人 MITSUBISHI ELECTRIC CORP 发明人 MANABE SHINYA
分类号 G05B23/02 主分类号 G05B23/02
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