发明名称 FOREIGN MATTER DETECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a non-contact power supply system capable of quickly detecting deterioration of transmission efficiency due to a conductive foreign matter.SOLUTION: A non-contact power supply system comprises: temperature detection means 6 for detecting temperature distribution in a magnetic field formed by an electric power supply device for performing power transmission to a power incoming device in a non-contact manner; and signal processing means 7 for detecting a conductive foreign matter in the magnetic field on the basis of the detection result by the temperature detection means 6.
申请公布号 JP2014135796(A) 申请公布日期 2014.07.24
申请号 JP20130001070 申请日期 2013.01.08
申请人 IHI CORP 发明人 NIITSUMA SUNAO
分类号 H02J17/00;G08B21/00;H02J7/00 主分类号 H02J17/00
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