发明名称 ELECTROCHROMIC LITHIUM NICKEL GROUP 4 MIXED METAL OXIDES
摘要 Multi-layer electrochromic structures comprising an anodic electrochromic layer comprising a lithium nickel oxide composition on a first substrate, the anodic electrochromic layer comprising lithium, nickel and a Group 4 metal selected from titanium, zirconium, hafnium and a combination thereof, wherein (i) the atomic ratio of lithium to the combined amount of nickel and such Group 4 metal(s) in the anodic electrochromic layer is at least 0.4:1, respectively, (ii) the atomic ratio of the amount of such Group 4 metal(s) to the combined amount of nickel and such Group 4 metal(s) in the anodic electrochromic layer is at least about 0.025:1, respectively, and (iii) the anodic electrochromic layer exhibits an interplanar distance (d-spacing) of at least 2.5 Å as measured by X-ray diffraction (XRD), comprises at least 0.05 wt. % carbon, and/or has a coloration efficiency absolute value of at least 19 cm2/C.
申请公布号 US2014204446(A1) 申请公布日期 2014.07.24
申请号 US201414160365 申请日期 2014.01.21
申请人 KINESTRAL TECHNOLOGIES, INC. 发明人 CHOI Hye Jin;BAILEY Mark;BASS John David;von KUGELGEN Stephen Winthrop;LACHMAN Eric;TURNER Howard W.;BIGI Julian P.
分类号 G02F1/153 主分类号 G02F1/153
代理机构 代理人
主权项 1. A multi-layer electrochromic structure comprising a first substrate and an anodic electrochromic layer comprising a lithium nickel oxide composition on the first substrate, the anodic electrochromic layer containing lithium, nickel, and at least one Group 4 metal selected from the group consisting of titanium, zirconium, and hafnium, wherein (i) the atomic ratio of lithium to the combined amount of nickel and such Group 4 metal(s) in the anodic electrochromic layer is at least 0.4:1, respectively, (ii) the atomic ratio of the amount of such Group 4 metal(s) to the combined amount of nickel and such Group 4 metal(s) in the anodic electrochromic layer is at least about 0.025:1, respectively, and (iii) the anodic electrochromic layer exhibits an interplanar distance (d-spacing) of at least 2.5 Å as measured by X-ray diffraction (XRD).
地址 SOUTH SAN FRANCISCO CA US