A METHOD FOR ANALYZING NANOPARTICLE USING SCANNING PROBE MICROSCOPE(SPM)-IMPEDANCE ANALYZER
摘要
<p>The present invention relates to a method to determine protein bond of nanoparticles using a scanning probe microscope-impedance analyzer. Also, the present invention can detect protein bonded to the nanoparticles by constructing a database for impedance intrinsic to the protein.</p>
申请公布号
KR101421887(B1)
申请公布日期
2014.07.22
申请号
KR20130018500
申请日期
2013.02.21
申请人
INDUSTRY-ACADEMIC COOPERATION FOUNDATION, YONSEI UNIVERSITY
发明人
LEE, SANG YUP;PARK, SOO IN;KWAK, JIN YOUNG;PARK, SANG WOO;KIM, SUN HYOUNG;LIM, YOUNG JUN
