发明名称 TUNING A PARAMETER ASSOCIATED WITH PLASMA IMPEDANCE
摘要 Disclosed are a system and a method for tuning plasma which is associated with a plasma impedance. One of methods includes a step of receiving information in order to determine a variable. Information is measured in a transmission line in case a parameter has a first value. The transmission line is used when providing electric power to a plasma chamber. The method further includes the following steps of: determining whether a variable is in a local minimum value or not; and providing a first value in order to tune an impedance matching circuit in case the variable is in the local minimum value. The method also includes the following steps of: changing the first value into a second value of a parameter in case the variable is not in the local minimum value; and determining whether the parameter is in the local minimum value or not in case the parameter has the second value.
申请公布号 KR20140091498(A) 申请公布日期 2014.07.21
申请号 KR20140004239 申请日期 2014.01.13
申请人 LAM RESEARCH CORPORATION 发明人 VALCORE JR. JOHN C.;LYNDAKER BRADFORD J.
分类号 H03H7/40;H05H1/46 主分类号 H03H7/40
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