发明名称 FILM-FORMING METHOD FOR FORMING SILICON OXIDE FILM ON TUNGSTEN FILM OR TUNGSTEN OXIDE FILM
摘要 A film-forming method includes forming a tungsten film or a tungsten oxide film on an object to be processed, heating the object on which the tungsten film or the tungsten oxide film is formed, forming a seed layer on the tungsten film or the tungsten oxide film by supplying an aminosilane-based gas to a surface of the tungsten film or the tungsten oxide film, and forming a silicon oxide film on the seed layer by simultaneously supplying a silicon material gas including silicon and a gas including an oxidizing agent for oxidizing silicon.
申请公布号 US2014199839(A1) 申请公布日期 2014.07.17
申请号 US201414190416 申请日期 2014.02.26
申请人 TOKYO ELECTRON LIMITED 发明人 SATO Jun;Chou Pao-Hwa
分类号 H01L21/02 主分类号 H01L21/02
代理机构 代理人
主权项 1. A film-forming method of forming a silicon oxide film, the film-forming method comprising: forming a tungsten film or a tungsten oxide film on an object to be processed; heating the object on which the tungsten film or the tungsten oxide film is formed; forming a seed layer on the tungsten film or the tungsten oxide film by supplying an aminosilane-based gas to a surface of the tungsten film or the tungsten oxide film; and forming a silicon oxide film on the seed layer by simultaneously supplying a silicon material gas including silicon and a gas including an oxidizing agent for oxidizing silicon.
地址 Tokyo JP