METHOD AND APPARATUS FOR IMPROVED SAMPLING RESOLUTION IN X-RAY IMAGING SYSTEMS

摘要

The present invention pertains to an apparatus and method for X-ray imaging wherein a radiation source comprising rows of discrete emissive locations can be positioned such that these rows are angularly offset relative to rows of sensing elements on a radiation sensor. A processor can process and allocate responses of the sensing elements in appropriate memory locations given the angular offset between source and sensor. This manner of allocation can include allocating the responses into data rows associated with unique positions along a direction of columns of discrete emissive locations on the source. Mapping coefficients can be determined that map allocated responses into an image plane.