发明名称 METHOD OF FORMING SEMICONDUCTOR STRUCTURE HAVING CONTACT PLUG
摘要 A method of forming a semiconductor structure having at least a contact plug includes the following steps. At first, at least a transistor and an inter-layer dielectric (ILD) layer are formed on a substrate, and the transistor includes a gate structure and two source/drain regions. Subsequently, a cap layer is formed on the ILD layer and on the transistor, and a plurality of openings that penetrate through the cap layer and the ILD layer until reaching the source/drain regions are formed. Afterward, a conductive layer is formed to cover the cap layer and fill the openings, and a part of the conductive layer is further removed for forming a plurality of first contact plugs, wherein a top surface of a remaining conductive layer and a top surface of a remaining cap layer are coplanar, and the remaining cap layer totally covers a top surface of the gate structure.
申请公布号 US2014199837(A1) 申请公布日期 2014.07.17
申请号 US201313740289 申请日期 2013.01.14
申请人 UNITED MICROELECTRONICS CORP. 发明人 Hung Ching-Wen;Liou En-Chiuan;Huang Chih-Sen;Tsao Po-Chao
分类号 H01L21/768 主分类号 H01L21/768
代理机构 代理人
主权项 1. A method of forming a semiconductor structure having at least a contact plug, comprising: forming at least a transistor and an inter-layer dielectric (ILD) layer on a substrate, wherein the transistor comprises a gate structure and two source/drain regions; forming a cap layer on the ILD layer and on the transistor; forming a plurality of openings penetrating through the cap layer and the ILD layer until reaching the source/drain regions; forming a conductive layer covering the cap layer and filling the openings; and removing a part of the conductive layer for forming a plurality of first contact plugs, wherein a top surface of a remaining conductive layer and a top surface of a remaining cap layer are coplanar, and the remaining cap layer totally covers a top surface of the gate structure.
地址 Hsin-Chu City TW