发明名称 BRIGHTNESS MEASUING METHOD AND SYSTEM OF DEVICE WITH BACKLIGHT
摘要 A brightness measuring method of device with backlight is performed by a controlling device, for measuring legends of backlight provided by a backlight module of a device under test (DUT). The method includes turning on a uniform light source external to the DUT for illuminating the DUT; capturing and receiving an image of the DUT illuminated with uniform light as a base image; identifying a complete pattern of a to-be-measured legend in the base image; turning off the uniform light source and turning on the backlight of the DUT so as to illuminate the legend of DUT; capturing and receiving an image of the DUT illuminated with backlight as a comparison image, wherein the scope of the comparison image overlaps the scope of the base image; and calculating brightness values of a plurality of pixels in the comparison image whose positions overlap the positions of the complete pattern.
申请公布号 US2014198205(A1) 申请公布日期 2014.07.17
申请号 US201314047068 申请日期 2013.10.07
申请人 LITE-ON TECHNOLOGY CORPORATION ;LITE-ON ELECTRONICS (GUANGZHOU) LIMITED 发明人 WU CHIN-FA
分类号 G06T7/00 主分类号 G06T7/00
代理机构 代理人
主权项 1. A brightness measuring method of device with backlight, performed by a controlling device to measure a legend of backlight provided by a backlight module of a device under test (DUT), the method comprising: turning on a uniform light source external to the DUT so as to illuminate the DUT; indicating to capture an image of the DUT illuminated with the uniform light source as a base image; receiving the base image; identifying a complete pattern of a to-be-measured legend in the base image; turning off the uniform light source while turning on the backlight of the DUT, so as to let the backlight illuminate the DUT; indicating to capture an image of the DUT illuminated with the backlight as a comparison image; receiving the comparison image, wherein the scope of the comparison image overlaps the scope of the base image; and calculating the brightness values for a plurality of pixels in the comparison image whose positions overlap the positions of the complete pattern so as to obtain a backlight brightness of the legend.
地址 Taipei City TW