发明名称 |
BRIGHTNESS MEASUING METHOD AND SYSTEM OF DEVICE WITH BACKLIGHT |
摘要 |
A brightness measuring method of device with backlight is performed by a controlling device, for measuring legends of backlight provided by a backlight module of a device under test (DUT). The method includes turning on a uniform light source external to the DUT for illuminating the DUT; capturing and receiving an image of the DUT illuminated with uniform light as a base image; identifying a complete pattern of a to-be-measured legend in the base image; turning off the uniform light source and turning on the backlight of the DUT so as to illuminate the legend of DUT; capturing and receiving an image of the DUT illuminated with backlight as a comparison image, wherein the scope of the comparison image overlaps the scope of the base image; and calculating brightness values of a plurality of pixels in the comparison image whose positions overlap the positions of the complete pattern. |
申请公布号 |
US2014198205(A1) |
申请公布日期 |
2014.07.17 |
申请号 |
US201314047068 |
申请日期 |
2013.10.07 |
申请人 |
LITE-ON TECHNOLOGY CORPORATION ;LITE-ON ELECTRONICS (GUANGZHOU) LIMITED |
发明人 |
WU CHIN-FA |
分类号 |
G06T7/00 |
主分类号 |
G06T7/00 |
代理机构 |
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代理人 |
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主权项 |
1. A brightness measuring method of device with backlight, performed by a controlling device to measure a legend of backlight provided by a backlight module of a device under test (DUT), the method comprising:
turning on a uniform light source external to the DUT so as to illuminate the DUT; indicating to capture an image of the DUT illuminated with the uniform light source as a base image; receiving the base image; identifying a complete pattern of a to-be-measured legend in the base image; turning off the uniform light source while turning on the backlight of the DUT, so as to let the backlight illuminate the DUT; indicating to capture an image of the DUT illuminated with the backlight as a comparison image; receiving the comparison image, wherein the scope of the comparison image overlaps the scope of the base image; and calculating the brightness values for a plurality of pixels in the comparison image whose positions overlap the positions of the complete pattern so as to obtain a backlight brightness of the legend. |
地址 |
Taipei City TW |