发明名称 ETCHING METHOD
摘要 Provided are an etching method capable of increasing an etching selectivity between a subject material and a resist, a sapphire substrate processed using the etching method, and a light-emitting device including the sapphire substrate. An etching method using a plasma etching apparatus includes: a resist film forming step of forming a resist film on a subject material; a pattern forming step of forming a predetermined pattern on the resist film; a resist degenerating step of exposing the resist film on which the pattern is formed to plasma under a predetermined degeneration condition to degenerate the resist film and increase an etching selectivity; and a subject material etching step of exposing the subject material to plasma under an etching condition different from the degeneration condition to etch the subject material using the resist film having an increased etching selectivity as a mask.
申请公布号 KR20140090209(A) 申请公布日期 2014.07.16
申请号 KR20147013080 申请日期 2012.11.06
申请人 EL-SEED CORPORATION 发明人 SUZUKI ATSUSHI;NANIWAE KOICHI;KONDO TOSHIYUKI;MORI MIDORI;TERAMAE FUMIHARU
分类号 H01L21/3065;H01L33/22 主分类号 H01L21/3065
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