发明名称 METAL LAYER FABRICATION METHOD FOR SEMICONDUCTOR DEVICE
摘要 Disclosed is a method for forming a metal layer of a semiconductor device. The method for forming a metal layer of a semiconductor device according to an embodiment of the present invention includes forming a nuclear generation layer on a semiconductor substrate; and forming a metal layer on the nuclear generation layer having a predetermined thickness while removing impurities included inside the metal layer.
申请公布号 KR20140089646(A) 申请公布日期 2014.07.16
申请号 KR20130000704 申请日期 2013.01.03
申请人 WONIK IPS CO., LTD. 发明人 YOON, WON JUN;RYU, DONG HO;PARK, YOUNG HOON
分类号 H01L21/20 主分类号 H01L21/20
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