发明名称 Combined ion irradiation and ion radiography device
摘要 <p>The invention relates to an irradiation arrangement (1, 3) for irradiating a workpiece (12) with a particle beam (10). The irradiation arrangement (1, 3) comprises a particle beam supply device (2, 9), a workpiece accommodation device (13) and a position-sensitive particle monitoring device (14), characterised in that the position-sensitive particle monitoring device (14) is arranged on the distal side of the workpiece accommodation device (13), when seen from the particle beam supply device (2, 9).</p>
申请公布号 EP2602003(B1) 申请公布日期 2014.07.16
申请号 EP20110192198 申请日期 2011.12.06
申请人 GSI HELMHOLTZZENTRUM FÜR SCHWERIONENFORSCHUNG GMBH 发明人 DURANTE, MARCO;STÖCKER, HORST
分类号 A61N5/10;G21K5/02;G21K5/04 主分类号 A61N5/10
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