| 发明名称 | Generated gas collecting method and measuring method | ||
| 摘要 | According to one embodiment, a generated gas collecting method collects a generated gas after exposing the interior of a chamber to an organic gas having a boiling point higher than that of the generated gas. | ||
| 申请公布号 | US8776577(B2) | 申请公布日期 | 2014.07.15 |
| 申请号 | US201213366101 | 申请日期 | 2012.02.03 |
| 申请人 | Kabushiki Kaisha Toshiba | 发明人 | Komatsu Akihiro;Imamura Takahiro |
| 分类号 | G01N25/00;B01D53/02 | 主分类号 | G01N25/00 |
| 代理机构 | Patterson & Sheridan, LLP | 代理人 | Patterson & Sheridan, LLP |
| 主权项 | 1. A generated gas collecting method, comprising: exposing an interior of a chamber to an organic gas that comprises C40H82, the organic gas having a boiling point that is higher than a boiling point of a generated gas that is generated from a sample to be placed in the chamber; placing the sample in the chamber; supplying a carrier gas into the chamber while heating the sample in the chamber, and bringing the carrier gas and the generated gas that has been generated from the sample in the chamber into contact with an adsorption member. | ||
| 地址 | Tokyo JP | ||