发明名称 |
CURRENT APPLICATION DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR ELEMENT |
摘要 |
Provided is a current application device capable of applying a test current of a magnitude necessary for testing of a semiconductor element without any trouble. A current application device 1 is configured to have a contacting section having a plurality of projections 21 for contacting a contact region 24 inside an active region 23 of a semiconductor element 22 and applying the test current thereto, and a pressing section 3 which presses the contacting section 2 against the semiconductor element 22 such that each projection 21 contacts the contact region 24. A plurality of the projections 21 are arranged such that an arrangement density of outside projections 21 is larger than the arrangement density of inside projections 21. |
申请公布号 |
US2014193928(A1) |
申请公布日期 |
2014.07.10 |
申请号 |
US201414147868 |
申请日期 |
2014.01.06 |
申请人 |
Honda Motor Co., Ltd. |
发明人 |
Hasegawa Satoshi;Akahori Shigeto;Maita Shinya;Saito Hitoshi;Yamaji Yoko |
分类号 |
G01R1/073;H01L21/66 |
主分类号 |
G01R1/073 |
代理机构 |
|
代理人 |
|
主权项 |
1. A current application device, comprising:
a contacting section which includes a plurality of projections for contacting a contact region within an active region of a semiconductor element and for applying a test current thereto, in which an arrangement density of outside projections among the plurality of the projections becomes larger than an arrangement density of inside projections; and a pressing section which presses the contacting section against the semiconductor element such that the plurality of the projections contact the contact region. |
地址 |
Tokyo JP |