METHODS AND SYSTEMS FOR TESTING ELECTRONIC CIRCUITS

摘要

A system for testing electronic circuits is configured to receive a test signal and an ideal response signal and output a test result signal. The system for testing electronic circuits includes a circuit portion under test, a comparator and a comparison result recorder. The circuit portion under test receives a test signal from a test instrument, and outputs a system response signal. The comparator receives the system response signal from the circuit portion to be tested and receives an ideal response signal from the test instrument. The comparator outputs comparison results according to the system response signal and the ideal response signal. The comparison result recorder receives and records the comparison result. The system receives at least a portion of test signals and at least a portion of ideal response signals in a dynamically configurable time-interleaved manner via one or more physical channels from a test equipment.

主权项

1. An apparatus for testing an electronic circuit, comprising:
a demultiplexing circuitry that is to receive at least a multiplexed signal stream from a test equipment as an input to the apparatus to test the electronic circuit on a semiconductor substrate, wherein
the multiplexed signal stream is obtained by multiplexing at least a portion of a test signal and at least a portion of an ideal response signal, andthe test equipment is situated external to the semiconductor substrate on which the electronic circuit is located; a comparison module which is to compare a system response signal with the at least the portion of the ideal response signal, wherein
at least a part of the comparison module is located on the semiconductor substrate on which the electronic circuit to be tested is located; and a recording module which is to store a comparison result in a non-transitory computer or machine readable storage medium, wherein an interface is devised to transmit the test signal from the test equipment to the electronic circuit on the semiconductor substrate and to transmit the ideal response signal and comparison results between the test equipment and the comparison module.